Determining absolute Seebeck coefficients from relative thermopower measurements of thin films and nanostructures
Determining absolute Seebeck coefficients from relative thermopower measurements of thin films and nanostructures
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DOI:
10.1063/1.5143447
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发表时间:
2020-02-24
影响因子:
3.2
通讯作者:
Zink, B. L.
中科院分区:
文献类型:
--
作者:
Mason, S. J.;Hojem, A.;Zink, B. L.
Measurements of thermoelectric effects such as the Seebeck effect, the generation of electric field in response to an applied thermal gradient, are important for a range of thin films and nanostructures used in nanoscale devices subject to heating. In many cases, a clear understanding of the fundamental physics of these devices requires knowledge of the intrinsic thermoelectric properties of the material, rather than the so-called "relative" quantity that comes directly from measurements and always includes contributions from the voltage leads. However, for a thin film or nanostructure, determining the absolute Seebeck coefficient, alpha abs, is challenging. Here, we first overview the challenges for measuring alpha abs and then present an approach for determining alpha abs for thin films from relative measurements made with a micromachined thermal isolation platform at temperatures between 77 and 350K. This relies on a relatively simple theoretical description based on the Mott relation for a thin film sample as a function of thickness. We demonstrate this technique for a range of metal thin films, which show that alpha abs almost never matches expectations from tabulated bulk values, and that for some metals (most notably gold) even the sign of alpha abs can be reversed. We also comment on the role of phonon and magnon drag for some metal films. Published under license by AIP Publishing.