Multi-conditional SAT-ATPG for power-droop testing
Multi-conditional SAT-ATPG for power-droop testing
复制标题
用于功率下降测试的多条件 SAT-ATPG
DOI：
10.1109/ets.2012.6233026
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发表时间：
2012
期刊：
影响因子：
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通讯作者：
B. Becker
中科院分区：
文献类型：
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作者：
A. Czutro;M. Sauer;I. Polian;B. Becker
功率下降是由特定电源条件触发的与信号完整性相关的重要效应。高频和低频功率下降可能会导致IC在应用期间出现故障，但它们通常不会被最先进的制造测试方法检测到，因为故障激励会在几个时间帧内对全局开关活动施加特定条件。因此，用于功率下垂测试的ATPG（PD-ATPG）是一个非常困难的问题，尚未得到最佳解决。在本文中，我们使用一个基于SAT的ATPG引擎，该引擎采用一种称为SAT解决定性偏好的机制来生成一个解决方案，保证对于给定的一组优化标准是最优的，但代价是高SAT解决时间。因此，必须为SAT公式化选择一组平衡良好的标准，以获得尽可能好的解决方案，而不会使SAT实例变得不切实际。我们探索了几种策略，并进行了实验评估。
Power droop is a non-trivial signal-integrity-related effect triggered by specific power-supply conditions. High-frequency and low-frequency power droop may lead to failure of an IC during application time, but they usually remain undetected by state-of-the-art manufacturing test methods, as the fault excitation imposes particular conditions on global switching activity over several time frames. Hence, ATPG for power-droop test (PD-ATPG) is an extremely hard problem that has not yet been solved optimally. In this paper, we use a SAT-based ATPG engine that employs a mechanism known as SAT-solving with qualitative preferences to generate a solution guaranteed to be optimal for a given set of optimisation criteria, however at the expense of high SAT-solving times. Therefore, a well-balanced set of criteria has to be chosen for the SAT-formulation in order to get as good solutions as possible without rendering the SAT-instances impracticably hard. We explore several strategies and evaluate them experimentally.