On-the-fly scans for X-ray ptychography
On-the-fly scans for X-ray ptychography
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DOI：
10.1063/1.4904943
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发表时间：
2014-12-22
影响因子：
4
通讯作者：
Menzel, Andreas
中科院分区：
文献类型：
--
作者：
Pelz, Philipp M.;Guizar-Sicairos, Manuel;Menzel, Andreas
随着纳米技术的日益重要，对纳米分辨率的介观物体实时可靠成像的需求日益增加。x射线平面摄影是一种在扩展视场上提供纳米分辨率的扫描显微技术，扫描系统的稳定时间是快速成像的瓶颈之一。在这里，我们证明了动态扫描，即在样品以恒定速度扫描时收集衍射图案，可以建模为探测辐射的状态混合，并允许可靠的图像恢复。讨论了不同扫描参数下探针模式的特性，并考虑了在显著缩短扫描时间方面的应用。(C) 2014 AIP出版有限责任公司
With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the scanning system is one of the bottlenecks for fast imaging. Here, we demonstrate that ptychographic on-the-fly scans, i.e., collecting diffraction patterns while the sample is scanned with constant velocity, can be modelled as a state mixture of the probing radiation and allow for reliable image recovery. Characteristics of the probe modes are discussed for various scan parameters, and the application to significantly reducing the scanning time is considered. (C) 2014 AIP Publishing LLC.