Magneto‐optical Kerr effect of rf‐sputtered PtMnSb thin films
Magneto‐optical Kerr effect of rf‐sputtered PtMnSb thin films
复制标题
射频溅射 PtMnSb 薄膜的磁光克尔效应
DOI:
10.1063/1.337948
复制
发表时间:
1987
影响因子:
3.2
通讯作者:
K. Matsubara
中科院分区:
文献类型:
--
作者:
R. Ohyama;T. Koyanagi;K. Matsubara
Thin films of the C1b‐phase Heusler alloy PtMnSb, prepared by rf sputtering and subsequent annealing, have been studied in order to assess the high magneto‐optical Kerr effect of this compound. The room‐temperature saturation magnetization (Ms) and coercive force (Hc) for PtMnSb thin films after being annealed at 500 °C were about 400 emu/cm3 and 110 Oe, respectively. The easy axis of magnetization was parallel to the film plane for all films. The polar Kerr rotation θK for the PtMnSb films with a C1b phase has a maximum value in excess of 1.8° at 710‐nm wavelength in a 5‐kOe external magnetic field perpendicular to the film plane. Thin films substituted with Ni for Pt, which are an admixture of PtMnSb and an isoelectronic compound NiMnSb, are also examined. The θK peak showed a red shift, in contrast with PtMnSb containing excess Pt concentration, where a blue shift was observed. The intensity reduced significantly with increasing Ni concentration in the films.