Direct measurement of the melting temperature of supported DNA by electrochemical method
Direct measurement of the melting temperature of supported DNA by electrochemical method
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DOI:
10.1093/nar/gng150
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发表时间:
2003-12-01
影响因子:
14.9
通讯作者:
Latruffe, N
中科院分区:
文献类型:
--
作者:
Meunier-Prest, R;Raveau, S;Latruffe, N
The development of biosensors based on DNA hybridization requires a more precise knowledge of the thermodynamics of the hybridization at a solid interface. In particular, the selectivity of hybridization can be affected by a lot of parameters such as the single-strand (ss)DNA density, the pH, the ionic strength or the temperature. The melting temperature, T-m, is in part a function of the ionic strength and of the temperature and therefore provides a useful variable in the control of the selectivity and sensitivity of a DNA chip. The electrochemical technique has been used to determine the T-m values when the probe is tethered by a DNA self-assembled monolayer (SAM). We have built a special thin layer cell, which allows the recording of the cyclic voltammogram under controlled temperature conditions. T-m has been determined by recording the thermogram (current versus temperature) of a redox indicator on a double-stranded hybrid (dsDNA) modified electrode and comparison with the corresponding ssDNA response. T-m of supported DNA varies linearly with the ionic strength. The stability of the SAMs has been considered and comparison between T-m in solution and on a solid support has been discussed.