Analytical solution of subthreshold channel potential of gate underlap cylindrical gate-all-around MOSFET

Analytical solution of subthreshold channel potential of gate underlap cylindrical gate-all-around MOSFET
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DOI:
10.1016/j.endend.2010.06.030
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发表时间:
2010-07
期刊:
Journal of End-to-end-testing
影响因子:
--
通讯作者:
Lining Zhang;Chenyue Ma;Jin He;Xinnan Lin;M. Chan
Lining Zhang;Chenyue Ma;Jin He;Xinnan Lin;M. Chan
中科院分区:
其他
文献类型:
--
作者:
Lining Zhang;Chenyue Ma;Jin He;Xinnan Lin;M. Chan

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