MICROWAVE CAVITY PERTURBATION TECHNIQUE .1. PRINCIPLES
MICROWAVE CAVITY PERTURBATION TECHNIQUE .1. PRINCIPLES
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DOI：
10.1007/bf02086216
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发表时间：
1993-12-01
期刊：
影响因子：
--
通讯作者：
GRUNER, G
中科院分区：
文献类型：
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作者：
KLEIN, O;DONOVAN, S;GRUNER, G
本文综述了从微波腔微扰测量中提取化合物的复电导率的分析方法。我们打算给出一种适用于任意电导率的球状样品的普遍处理方法，该样品放置在腔的电场或磁场反极点处。首先，我们建立了球形样品的测量参数与电导率之间的关系。接下来，我们将这些结果推广到椭球体的情况；我们第一次涵盖了人们可以用来研究腔内任意导电样品的所有不同构型：特别是解决了样品相对于外场的所有可能的取向。
This report reviews the analysis used to extract the complex conductivity of a compound from a microwave cavity perturbation measurement. We intend to present a generalized treatment valid for any spheroidally shaped sample of arbitrary conductivity which is placed at either the electric or magnetic field antinode of the cavity. To begin with, we establish the relationship between the measured parameters and the conductivity for a spherical sample. Next, we extend these results to the case of spheroids; and for the first time, we cover all different configurations that one can possibly use to study an arbitrary conducting sample inside a cavity: in particular, all possible orientations of the sample with respect to the applied field are solved.