Measurement of conductivity profiles in acceptor-doped strontium titanate
Measurement of conductivity profiles in acceptor-doped strontium titanate
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DOI：
10.1016/s0955-2219(98)00317-3
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发表时间：
1999-01-01
影响因子：
5.7
通讯作者：
Maier, J
中科院分区：
文献类型：
--
作者：
Rodewald, S;Fleig, J;Maier, J
采用圆形微电极的空间分辨微接触阻抗谱被应用于受主掺杂的SrTiO 3。它表明，局部体电导率可以得到的空间分辨率下降到10 μ m的范围内。特别是，电导率分布在电着色样品进行测量，揭示了一个非常典型的轮廓形状。该实验证实了SrTiO_3中电阻退化的现有模型。多晶材料中的测量产生单个晶粒内的电导率变化，其可以与在晶界处的氧空位阻挡和相应的化学计量变化有关。(C)1999年爱思唯尔科学有限公司。All rights reserved.
Spatially resolved microcontact impedance spectroscopy using circular microelectrodes is applied to acceptor-doped SrTiO3. It is demonstrated that local bulk conductivities can be obtained with a spatial resolution down to the 10 mu m range. In particular, conductivity profiles in electrocolored samples are measured, revealing a very characteristic profile shape. An existing model for the resistance degradation in SrTiO3 could be confirmed by this experiment. Measurements in polycrystalline material yield conductivity variations within single grains which can be related to oxygen vacancy blocking at grain boundaries and the cor responding stoichiometry variations. (C) 1999 Elsevier Science Limited. All rights reserved.