Determination of the element-specific complex permittivity using a soft x-ray phase modulator
Determination of the element-specific complex permittivity using a soft x-ray phase modulator
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使用软 X 射线相位调制器测定元素特定的复介电常数
DOI：
10.1103/physrevb.96.214417
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发表时间：
2017
影响因子：
3.7
通讯作者：
Matsuda I.
中科院分区：
文献类型：
--
作者：
Kubota Y.;Hirata Y.;Miyawaki J.;Yamamoto S.;Akai H.;Hobara R.;Yamamoto Sh.;Yamamoto K.;Someya T.;Takubo K.;Yokoyama Y.;Araki M.;Taguchi M.;Harada Y.;Wadati H.;Tsunoda M.;Kinjo R.;Kagamihata A.;Seike T.;Takeuchi M.;Tanaka T.;Shin S.;Matsuda I.
我们报告直接确定复介电常数张量使用的方法相结合的开发光源从分段交叉波荡器的同步辐射和磁光克尔效应。经验介电常数承载着材料的电子和磁信息，具有元素特异性，并通过巡游电子系统的量子力学计算得到了完美的证实。这些结果有助于理解光与物质的相互作用，并且它们提供了一种有趣的方法来寻找最佳材料作为光学元件，例如，在扩展紫外光刻技术或最先进的激光技术中。
We report on directly determining the complex permittivity tensor using a method combining a developed light source from a segmented cross undulator of synchrotron radiation and the magneto-optical Kerr effect. The empirical permittivity, which carries the electronic and magnetic information of a material, has element specificity and has perfect confirmation using the quantum-mechanical calculation for itinerant electrons systems. These results help in understanding the interaction of light and matter, and they provide an interesting approach to seek the best materials as optical elements, for example, in extended-ultraviolet lithographic technologies or in state-of-the-art laser technologies.