Microcavity polariton linewidths in the weak-disorder regime

Microcavity polariton linewidths in the weak-disorder regime
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弱无序状态下的微腔极化子线宽

DOI:
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发表时间:
2000
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通讯作者:
J. Hvam
J. Hvam
中科院分区:
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文献类型:
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作者:
P. Borri;W. Langbein;U. Woggon;J. R. Jensen;J. Hvam

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测量了在弱无序区具有不同激子非均匀展宽的一系列高质量微腔中的极化线宽。实验表明,当极化子能量远离激子吸收的尾部时,无序对极化子线宽的影响被抵消。将测量的线宽与用测量的裸量子阱的激子吸收谱估算的线宽进行了定量比较,发现两者有很好的一致性。
Polariton linewidths have been measured in a series of high-quality microcavities with different excitonic inhomogeneous broadening in the weak-disorder regime. We show experimentally that the influence of the disorder on the polariton linewidths is canceled when the polariton energies are far in the tail of the excitonic absorption. The measured linewidths are quantitatively compared with an estimation using the measured excitonic absorption spectrum of the bare quantum wells, and good agreement is found.