X‐ray diffraction study of interdiffusion in bimetallic Au/Pd thin films
X‐ray diffraction study of interdiffusion in bimetallic Au/Pd thin films
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双金属Au/Pd薄膜相互扩散的X射线衍射研究
DOI：
10.1063/1.323060
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发表时间：
1976
影响因子：
3.2
通讯作者：
J. Fodor
中科院分区：
文献类型：
--
作者：
M. Murakami;D. Defontaine;J. Fodor
Houska及其同事最近开发的X射线衍射技术被应用于测量3.3 μ Au-60 at.% Pd薄膜。该技术包括匹配的实验强度带，从假设的浓度分布计算。然后在相互扩散的第一阶段对给出最佳拟合的曲线进行Boltzmann-Matano分析。后期阶段进行了分析的线性扩散方程的帮助下，适用于一个有限的平板。发现实验确定的D值接近从本体高温测量外推的那些，但远离从150 A膜获得的那些。
An x‐ray diffraction technique recently developed by Houska and co‐workers was applied to the problem of measuring interdiffusion at 350 °C in 3.3 μ Au–60 at.% Pd bimetallic thin films. The technique consists of matching experimental intensity bands to those calculated from assumed concentration profiles. The profiles which gave best fit were then Boltzmann‐Matano analyzed during the first stages of interdiffusion. The later stages were analyzed with the help of a linear diffusion equation applied to a finite slab. Experimentally determined values of D were found to be close to those extrapolated from bulk high‐temperature measurements but far from those obtained from 150 A films.
DOI：
--
发表时间：
2008
期刊：
Ohmu-sba. 2nd Edition
影响因子：
--
作者：
S. Shimomura;R. Kimpara
通讯作者：
R. Kimpara