Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering.
Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering.
复制标题
通过表面增强拉曼散射绘制等离子体近场分布和干扰
DOI:
10.1038/srep03064
复制
发表时间:
2013-10-29
影响因子:
4.6
通讯作者:
Yuan X
中科院分区:
文献类型:
--
作者:
Du L;Lei DY;Yuan G;Fang H;Zhang X;Wang Q;Tang D;Min C;Maier SA;Yuan X
Mapping near-field profiles and dynamics of surface plasmon polaritons is crucial for understanding their fundamental optical properties and designing miniaturized photonic devices. This requires a spatial resolution on the sub-wavelength scale because the effective polariton wavelength is shorter than free-space excitation wavelengths. Here by combining total internal reflection excitation with surface-enhanced Raman scattering imaging, we mapped at the sub-wavelength scale the spatial distribution of the dominant perpendicular component of surface plasmon fields in a metal nanoparticle-film system through spectrally selective and polarization-resolved excitation of the vertical gap mode. The lateral field-extension at the junction, which is determined by the gap-mode volume, is small enough to distinguish a spot size ~0.355λ0generated by a focused radially polarized beam with high reproducibility. The same excitation and imaging schemes are also used to trace near-field nano-focusing and interferences of surface plasmon polaritons created by a variety of plasmon lenses.