Measurements of the exchange stiffness of YIG films using broadband ferromagnetic resonance techniques
Measurements of the exchange stiffness of YIG films using broadband ferromagnetic resonance techniques
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DOI：
10.1088/0022-3727/48/1/015001
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发表时间：
2015-01-14
影响因子：
3.4
通讯作者：
Conca, A.
中科院分区：
文献类型：
--
作者：
Klingler, S.;Chumak, A. V.;Conca, A.
给出了钇铁石榴石 (YIG) 薄膜的交换刚度 D 和交换常数 A 的测量结果。使用微波装置在 5 至 40 GHz 的宽频率范围内研究厚度为 0.9 至 2.6 μm 的 YIG 薄膜。测量是在面内和面外施加外部静磁场的情况下进行的。 Schreiber 和 Frait (1996 Phys. Rev. B 54 6473) 的方法基于分析垂直驻旋波模式频率对所施加的面外磁场的依赖性，用于获得交换刚度 D。对该方法进行了修改，以避免在确定交换刚度时受到内部磁场的影响。此外，该方法还适用于平面内测量。比较使用所有方法获得的结果，D 值介于 (5.18 +/- 0.01) 之间。 10(-17) T.m(2) 和 (5.40 +/- 0.02)。对于不同的厚度获得了10(-17) T.m(2)。由此计算出交换常数为 A = (3.7 +/- 0.4) pJ.m(-1)。
Measurements of the exchange stiffness D and the exchange constant A of Yttrium Iron Garnet (YIG) films are presented. YIG films with thicknesses from 0.9 to 2.6 mu m were investigated with a microwave setup in a wide frequency range from 5 to 40 GHz. The measurements were performed with the external static magnetic field applied in-plane and out-of-plane. The method of Schreiber and Frait (1996 Phys. Rev. B 54 6473), based on the analysis of the perpendicular standing spin wave mode frequency dependence on the applied out-of-plane magnetic field, was used to obtain the exchange stiffness D. This method was modified to avoid the influence of internal magnetic fields during the determination of the exchange stiffness. Furthermore, the method was also adapted for in-plane measurements. The results obtained using all methods are compared and values of D between (5.18 +/- 0.01). 10(-17) T. m(2) and (5.40 +/- 0.02). 10(-17) T. m(2) were obtained for different thicknesses. From this, the exchange constant was calculated to be A = (3.7 +/- 0.4) pJ.m(-1).