A scanning tunneling microscopy study of the surface microstructure of alpha‐ and beta‐lead dioxide
A scanning tunneling microscopy study of the surface microstructure of alpha‐ and beta‐lead dioxide
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α-和β-二氧化铅表面微观结构的扫描隧道显微镜研究
DOI：
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发表时间：
1990
期刊：
影响因子：
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通讯作者：
M. Horne
中科院分区：
文献类型：
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作者：
B. Sexton;G. F. Cotterill;S. Fletcher;M. Horne
纯 α- 和 β- 二氧化铅 (PbO2) 样品的表面微观结构已通过扫描隧道显微镜 (STM) 解析。将观察到的微晶尺寸与 X 射线衍射 (XRD) 推导的值进行比较，并将相同的数据与其他表征方法的结果进行比较，包括扫描电子显微镜 (SEM)、Brunauer-Emmett-Teller (BET) 表面积测量、汞孔隙率测定法和电化学还原。 α-PbO2 和 β-PbO2 表面积的巨大差异可以通过渗透到 β 结构的微裂纹来解释。 STM 图像清楚地显示了这些微裂纹。
The surface microstructures of specimens of pure alpha‐ and beta‐lead dioxide (PbO2 ) have been resolved with scanning tunnel microscopy (STM). Observed crystallite sizes are compared with values deduced from x‐ray diffraction (XRD), and the same data are compared with results from other characterization methods including scanning electron microscopy (SEM), Brunauer–Emmett–Teller (BET) surface area measurements, mercury porosimetry and electrochemical reduction. The large difference in surface area between alpha‐ and beta‐PbO2 is explained by microcracks permeating the beta structure. The STM images show these microcracks clearly.