Measuring x-ray polarization in the presence of systematic effects: known background
Measuring x-ray polarization in the presence of systematic effects: known background
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在存在系统效应的情况下测量 X 射线偏振：已知背景
DOI：
10.1117/12.924889
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发表时间：
2012
影响因子：
4.8
通讯作者：
M. Weisskopf
中科院分区：
文献类型：
--
作者：
R. Elsner;S. O’Dell;M. Weisskopf
在中断了37年多之后，近年来完成天文源x射线偏振测量的前景有所增长。不幸的是，伴随这长时间的中断，对这些源的x射线偏振测量的统计不确定性产生了一些混乱。我们已经启动了一个程序来进行详细的计算，以深入了解与x射线偏振测量相关的不确定性。在这里，我们描述了一个数学公式，用于确定在（极化或非极化）背景存在下x射线（线性）偏振的幅度和位角的1和2参数误差。我们进一步回顾了相关统计数据，包括明确区分最小可探测偏振（MDP）和偏振测量的准确性。
The prospects for accomplishing x-ray polarization measurements of astronomical sources have grown in recent years, after a hiatus of more than 37 years. Unfortunately, accompanying this long hiatus has been some confusion over the statistical uncertainties associated with x-ray polarization measurements of these sources. We have initiated a program to perform the detailed calculations that will offer insights into the uncertainties associated with x-ray polarization measurements. Here we describe a mathematical formalism for determining the 1- and 2-parameter errors in the magnitude and position angle of x-ray (linear) polarization in the presence of a (polarized or unpolarized) background. We further review relevant statistics—including clearly distinguishing between the Minimum Detectable Polarization (MDP) and the accuracy of a polarization measurement.