A fully-digital EM pulse detector
A fully-digital EM pulse detector
复制标题
全数字电磁脉冲探测器
DOI：
10.3850/9783981537079_0164
复制
发表时间：
2016
期刊：
影响因子：
--
通讯作者：
P. Maurine
中科院分区：
文献类型：
--
作者：
David El;J. Rigaud;P. Maurine
电磁脉冲注入（EMPI）最近已被证明是一种有效的故障注入技术，具有许多优点，特别是当考虑嵌入在球栅阵列封装上的片上系统（SoC）的安全问题时，即当对手不容易访问背面时。因此，从现在开始，EMPI必须被视为对智能卡和SoC的真实的威胁。在通常的故障攻击对策中，可以确定使用嵌入式传感器。如果在文献中可以找到电压毛刺或激光射击检测器，那么只有一个建议提出了检测电磁脉冲（EMP）的想法。然而，这种前传感器需要微调一些时序特性，因此，其使用在本质上是异构的并且由全球团队设计的SoC中显得复杂甚至不切实际。在此背景下，本文介绍并实验验证了一种新的传感器允许检测EMP。由于传感器是全数字的，因此成本低，最重要的是完全符合SoC的标准设计流程。
ElectroMagnetic Pulse Injection (EMPI) has recently been demonstrated to be an efficient fault injection technique with many advantages especially when considering security issues of Systems on Chip (SoC) embedded on ball grid array packages, i.e. when adversaries do not have an easy access to the backside. EMPI must therefore be considered as a real threat against smartcards and SoC from now on. Among the usual countermeasures against fault attacks, one can identify the use of embedded sensors. If one can find voltage glitch or laser shot detectors in the literature, there is only one proposal which puts forward the idea of detecting ElectroMagnetic Pulse (EMP). However, this former sensor requires a fine tuning of some timing characteristics and, as a result, its use appears complex and even impractical within a SoC which are heterogeneous by nature and designed by worldwide teams. Within this context, this paper introduces and experimentally validates a new sensor allowing to detect EMP. Because the sensor is fully digital, it is low cost and above all fully compliant with the standard design flow of SoC.