X-Ray photoelectron diffraction and photoelectron holography as methods for investigating the local atomic structure of the surface of solids
X-Ray photoelectron diffraction and photoelectron holography as methods for investigating the local atomic structure of the surface of solids
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X 射线光电子衍射和光电子全息术作为研究固体表面局部原子结构的方法
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
A. S. Vorokh
中科院分区：
文献类型：
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作者：
M. Kuznetsov;I. Ogorodnikov;A. S. Vorokh
讨论了X射线光电子衍射（XPD）和光电子全息（PH）的理论和实验应用现状。这些方法正在迅速发展，并用于检查固体的表面原子结构，包括在气体吸附，外延膜生长等过程中表面上形成的纳米结构。通过这些方法进行分析的深度是几纳米，这使得有可能表征位于表面上和表面下的原子的位置。XPD和PH方法的一个显着特点是它们对所检查原子的类型敏感，并且在高能量分辨率的情况下，对所研究元素的特定化学形式敏感。对XPD和PH在各种表面结构研究中的实验应用数据进行了分析和归纳。参考书目包括121篇参考文献。
The state-of-the-art theory and experimental applications of X-ray photoelectron diffraction (XPD) and photoelectron holography (PH) are discussed. These methods are rapidly progressing and serve to examine the surface atomic structure of solids, including nanostructures formed on surfaces during adsorption of gases, epitaxial film growth, etc. The depth of analysis by these methods is several nanometres, which makes it possible to characterize the positions of atoms localized both on and beneath the surface. A remarkable feature of the XPD and PH methods is their sensitivity to the type of examined atoms and, in the case of high energy resolution, to the particular chemical form of the element under study. The data on experimental applications of XPD and PH to studies of various surface structures are analyzed and generalized. The bibliography includes 121 references.