Magnetic relaxation in metallic films: Single and multilayer structures
Magnetic relaxation in metallic films: Single and multilayer structures
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金属薄膜中的磁弛豫：单层和多层结构
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
G. Woltersdorf
中科院分区：
文献类型：
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作者：
B. Heinrich;R. Urban;G. Woltersdorf
讨论了金属薄膜中的本征磁弛豫效应。结果表明，金属中的本征衰减机制是由声子和磁子对巡回电子-空穴对激发的非相干散射引起的。访问数/每百万人：Reach for[L.Rev.B54,9353(1996)]表明，多层膜中自旋波和巡回电子之间的相互作用可以导致界面Gilbert衰减。用磁性单层和双层薄膜进行了铁磁共振(FMR)研究。双层结构的铁膜的铁磁共振线宽总是大于相同厚度的单层铁膜测得的铁磁共振线宽。铁磁共振线宽的增加与薄膜厚度成反比，并且与微波频率成线性关系。这些结果与伯杰的预测一致。
The intrinsic magnetic relaxations in metallic films will be discussed. It will be shown that the intrinsic damping mechanism in metals is caused by incoherent scattering of itinerant electron-hole pair excitations by phonons and magnons. Berger [L. Berger, Phys. Rev. B 54, 9353 (1996)] showed that the interaction between spin waves and itinerant electrons in multilayers can lead to interface Gilbert damping. Ferromagnetic resonance (FMR) studies were carried out using magnetic single and double layer films. The FMR linewidth of the Fe films in the double layer structures was found to always be larger than the FMR linewidth measured for the single Fe films having the same thickness. The increase in the FMR linewidth scaled inversely with the film thickness, and was found to be linearly dependent on the microwave frequency. These results are in agreement with Berger’s predictions.