Numerical prediction of rail roughness growth on tangent railway tracks

Numerical prediction of rail roughness growth on tangent railway tracks
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DOI:
10.1016/s0022-460x(03)00713-2
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发表时间:
2003-10-23
影响因子:
4.7
通讯作者:
Nielsen, JCO
Nielsen, JCO
中科院分区:
工程技术2区
文献类型:
--
作者:
Nielsen, JCO

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通过对直线轨道上列车 - 轨道动态相互作用的数值模拟,预测了轨头粗糙度(不规则性、波纹度)的增长。假设磨损是由驱动轮对引起的纵向滑动造成的,并且磨损与接触斑中的纵向摩擦功率成正比。从对应于新的或近期打磨过的钢轨的初始粗糙度谱出发,确定初始粗糙度轮廓。针对离散支撑轨道模型上的位置,计算一个轮对通过时的轮轨接触力、蠕滑和磨损。将计算出的磨损按照选定的轮对通过次数进行缩放,然后添加到初始粗糙度轮廓中。利用对荷兰某轨道上钢轨波纹的现场观测来验证模拟模型。模拟结果预测,对于30 - 40毫米左右的波长,粗糙度增长率较大。在这个波长区间内的较大增长是由于在固支 - 固支共振频率附近,靠近轨枕处的轨道导纳较低,再加上大量以匀速行驶的驱动客车轮对通过。在主要粗糙度波长和年磨损率方面,模拟结果与现场测量结果吻合良好。讨论了减少粗糙度增长的补救措施。(C)2003爱思唯尔有限公司。保留所有权利。
Growth of railhead roughness (irregularities, waviness) is predicted through numerical simulation of dynamic train-track interaction on tangent track. The hypothesis is that wear is caused by longitudinal slip due to driven wheelsets, and that wear is proportional to the longitudinal frictional power in the contact patch. Emanating from an initial roughness spectrum corresponding to a new or a recent ground rail, an initial roughness profile is determined. Wheel-rail contact forces, creepages and wear for one wheelset passage are calculated in relation to location along a discretely supported track model. The calculated wear is scaled by a chosen number of wheelset passages, and is then added to the initial roughness profile. Field observations of rail corrugation on a Dutch track are used to validate the simulation model. Results from the simulations predict a large roughness growth rate for wavelengths around 30-40 mm. The large growth in this wavelength interval is explained by a low track receptance near the sleepers around the pinned-pinned resonance frequency, in combination with a large number of driven passenger wheelset passages at uniform speed. The agreement between simulations and field measurements is good with respect to dominating roughness wavelength and annual wear rate. Remedies for reducing roughness growth are discussed. (C) 2003 Elsevier Ltd. All rights reserved.