Contact boundary conditions and the Dyakonov-Shur instability in high electron mobility transistors
Contact boundary conditions and the Dyakonov-Shur instability in high electron mobility transistors
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DOI:
10.1063/1.365895
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发表时间:
1997-08-01
影响因子:
3.2
通讯作者:
Crowne, FJ
中科院分区:
文献类型:
--
作者:
Crowne, FJ
Dyakonov and Shur have proposed a novel device structure based on de biasing an ordinary high electron mobility transistor (HEMT) while subjecting it to unusual ac boundary conditions at its source and drain [M. Dyakonov and M. Shur, Phys. Rev. Lett. 71, 2465 (1993)], Under these conditions, the drifting two-dimensional electron gas within the HEMT channel acts as a trapped one-component plasma which exhibits damped normal-mode oscillations similar to those of an organ pipe under zero de bias, and an unexpected instability and gain at large de biases. In this article, the work of Dyakanov and Shur is generalized by allowing the plasma more hydrodynamic degrees of freedom. In particular, it is found that the description used by Dyakonov and Shur must be generalized to incorporate a more complicated picture of the plasma modes. (C) 1997 American Institute of Physics.