Electrical property measurement of two-dimensional hole-gas layer on hydrogen-terminated diamond surface in vacuum-gap-gate structure
Electrical property measurement of two-dimensional hole-gas layer on hydrogen-terminated diamond surface in vacuum-gap-gate structure
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DOI：
10.1063/1.5099395
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发表时间：
2019-06
影响因子：
4
通讯作者：
M. Inaba;H. Kawarada;Y. Ohno
中科院分区：
文献类型：
--
作者：
M. Inaba;H. Kawarada;Y. Ohno
