Ferroelectric domain characterisation and manipulation : A challenge for scanning probe microscopy
Ferroelectric domain characterisation and manipulation : A challenge for scanning probe microscopy
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铁电域表征和操作：扫描探针显微镜的挑战
DOI：
10.1080/00150199908014811
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发表时间：
1999
期刊：
影响因子：
0.8
通讯作者：
H. Güntherodt
中科院分区：
文献类型：
--
作者：
L. Eng;M. Bammerlin;C. Loppacher;M. Guggisberg;R. Bennewitz;R. Lüthi;E. Meyer;T. Huser;H. Heinzelmann;H. Güntherodt
扫描力显微镜（SFM）可以解决纳米尺度的域写入和读取问题。与其他扫描探针方法相比，SFM 为在线数据控制提供了广泛的可能性。即偏振分布的三维映射、偏振和形貌之间的差异、直径为 60 nm 的域的纳米级域切换、纳米级磁滞回线的记录、相变映射。 9 nm分辨率的畴壁成像、铁电表面的原子分辨率等。所有这些问题都在本文中得到了报道。这种协调一致的研究具有挑战性的结果是使用 SFM 以纳米分辨率进行纳米级域写入和读取的可能性。图1说明了这样一个例子，其中线形c - 域被特意写入线宽为400 nm的铁电钛酸钡单晶中。通过这个数字，我们高度赞赏和尊重鲍勃·纽纳姆 (Bob Newnham) 的工作，传递我们对他的未来最好的纳米祝愿。
Domain writing and reading on the nanometer scale is addressed with scanning force microscopy (SFM) Compared to other scanning probe methods, SFM provides broad possibilities for the on-line data controlling. i.e. three-dimensional mapping of polarisation distribution, differentiation between polarisation and topography, nanoscale domain switching of domains with a 60 nm diameter, recording of nanoscale hysteresis loops, phase transition mapping. domain wall imaging with 9 nm resolution, atomic resolution of ferroelectric surfaces, etc. All these issues are reported in this paper. The challenging result of such a concerted investigation is the possibility of using SFM for nanoscale domain writing and reading with nanometer resolution. Fig. 1 illustrates such an example where line shaped c - domains are purposely written into a ferroelectric Barium-Titanate single crystal with a 400 nm line-width. With this figure we highly appreciate and honour the work of Bob Newnham passing our best nano-wishes for his future.