Electron irradiated potassium-silicate glass surfaces investigated by XPS
Electron irradiated potassium-silicate glass surfaces investigated by XPS
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DOI：
10.1016/j.jnoncrysol.2005.04.059
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发表时间：
2005-07
影响因子：
3.5
通讯作者：
J. Zemek;P. Jiříček;O. Gedeon;B. Lesiak;A. Józwik
中科院分区：
文献类型：
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作者：
J. Zemek;P. Jiříček;O. Gedeon;B. Lesiak;A. Józwik
用光电子能谱研究了钾硅酸盐玻璃在电子辐照下的原位断裂表面。钾的表面富集和非桥氧与桥氧的比率NBO/BO的增加被定量地确定为电子剂量的函数。采用模式识别方法对Si 2 p、O 1 s和K 2 p光电子能谱进行线形分析，得到了分析体积中存在的原子的化学键。结果表明，即使是新破裂的玻璃表面的组成和化学键的变化显着。相对于元素钾，电子辐照优先形成氧化钾。辐照玻璃的O 1 s线形状与电子束辐照玻璃SiO2的O 1 s线形状一致。除最高电子剂量为12000 C/m2外，辐照玻璃的Si 2 p线形状与电子束辐照玻璃的Si 2 p线形状一致。在这里，Si-Si键被认可，伴随着最高含量的氧化钾。
In-situ fractured and electron irradiated potassium-silicate glass surfaces were studied by photoelectron spectroscopy. The surface enrichment by potassium and increasing ratio of non-bridging to bridging oxygen, NBO/BO, were determined as a function of electron dose quantitatively. Chemical bonding of atoms present in analysed volume were obtained by the line-shape analysis of Si 2p, O 1s, and K 2p photoelectron spectra using the pattern recognition methods. Results showed that even the freshly fractured glass surface is changed considerably in composition and chemical bonding. Electron irradiation preferentially formed potassium oxide with respect to elemental potassium. The O 1s line-shapes of irradiated glass followed those recorded from the vitreous SiO2exposed to electron beam. The Si 2p line-shapes of irradiated glass were ascribed to those recorded from the vitreous SiO2exposed to electron beam with the exception of the highest electron dose of 12000C/m2. Here, Si–Si bond was recognised, accompanied with the highest content of oxidized potassium.