Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond
Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond
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DOI：
10.2116/analsci.26.217
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发表时间：
2010-02-01
影响因子：
1.6
通讯作者：
Jozwik, Adam
中科院分区：
文献类型：
--
作者：
Lesiak, Beata;Zemek, Josef;Jozwik, Adam
采用x射线激发埃格电子能谱（XAES）、x射线光电子能谱（XPS）和弹性峰电子能谱（EPES）方法研究了不同csp (2)/sp(3)比、结晶度条件和晶粒尺寸的纳米晶金刚石和高取向热解石墨样品。根据XPS估计了地表的成分。通过XAES一阶导数C - KLL光谱的宽度和XPS C - 1s光谱对组分的拟合计算了C - sp(2)/sp(3)比值。模式识别（PR）方法用于分析谱线形状，对不同的碳材料具有较高的识别精度。PR法是一种潜在的有用的鉴定方法，特别是在材料工程领域的技术应用和合成过程中化学反应产物的控制方面具有重要意义。
The X-ray excited Auger electron spectroscopy (XAES), X-ray photoelectron spectroscopy (XPS) and elastic peak electron spectroscopy (EPES) methods were applied in investigating samples of nanocrystalline diamond and highly oriented pyrolytic graphite of various C sp(2)/sp(3) ratios, crystallinity conditions and grain sizes. The composition at the surface was estimated from the XPS. The C sp(2)/sp(3) ratio was evaluated from the width of the XAES first derivative C KLL spectra and from fitting of XPS C 1s spectra into components. The pattern recognition (PR) method applied for analyzing the spectra line shapes exhibited high accuracy in distinguishing different carbon materials. The PR method was found to be a potentially useful approach for identification, especially important for technological applications in fields of materials engineering and for controlling the chemical reaction products during synthesis.