Experimental Study of Locking Phenomena on Oscillating Rings Implemented in Logic Devices
Experimental Study of Locking Phenomena on Oscillating Rings Implemented in Logic Devices
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DOI：
10.1109/tcsi.2019.2900017
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发表时间：
2019-07-01
影响因子：
5.1
通讯作者：
Fischer, Viktor
中科院分区：
文献类型：
--
作者：
Mureddu, Ugo;Bochard, Nathalie;Fischer, Viktor
振荡环因其易于集成、面积小、功耗低等优点，在CMOS逻辑器件中得到了广泛的应用。它们的主要缺点是它们倾向于彼此锁定和/或锁定到外部周期信号。这种锁定现象可以使基于自由运行的振荡器的系统不起作用。因此，对这一现象的原因以及如何避免这一现象进行详细研究至关重要。在本文中，我们使用最常用的环：环形振荡器，瞬态效应环形振荡器和自定时环的锁定现象进行了详细的检查。然后，我们分析了基于振荡环的不同用例锁定的后果，并提供设计建议，以最大限度地减少其影响。我们的研究结果可以帮助设计师在未来的设计中更好地预测锁定现象。为了确保结果的再现性，所有实验的VHDL代码都是可用的，可以从专用网页下载。
Oscillating rings are widely used in CMOS logic devices because they are easy to integrate, require low area and low power. Their main disadvantage is that they tend to lock to each other and/or to an external periodic signal. This locking phenomenon can render a system based on a freely running oscillator non-functional. A detailed study of the causes of the phenomenon and how to avoid it, is therefore of paramount importance. In this paper, we conduct a detailed examination of the locking phenomenon using the most commonly used rings: ring oscillators, transient effect ring oscillators, and self-timed rings. We then analyze the consequences of locking on different use cases based on oscillating rings and provide design recommendations to minimize its impact. Our results could help designers better anticipate locking phenomenon in their future designs. To ensure reproducibility of the results, the VHDL code of all the experiments is available and can be downloaded from a dedicated web page.