The growth mechanism and characterization of few-layer diphenyl dinaphthothienothiophene films prepared by vacuum deposition

The growth mechanism and characterization of few-layer diphenyl dinaphthothienothiophene films prepared by vacuum deposition
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真空沉积少层二苯基二萘并噻吩并噻吩薄膜的生长机理及表征

DOI:
10.1016/j.orgel.2019.07.014
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发表时间:
2019
影响因子:
3.2
通讯作者:
Kitamura Masatoshi
Kitamura Masatoshi
中科院分区:
工程技术3区
文献类型:
--
作者:
Hattori Yoshiaki;Kimura Yoshinari;Yoshioka Takumi;Kitamura Masatoshi

文献摘要

相似文献

利用真空沉积法制备了2,9-二苯基二萘[2,3-b:2′,3′-f]噻吩[3,2-b]噻吩(DPh-DNTT)薄膜,并对其生长机理进行了研究。除了通常用于表面形貌成像的原子力显微镜外,光学显微镜也被积极用于相同的目的。该技术可以快速、简便地对薄膜进行评价。光学显微镜图像显示,DPh-DNTT薄膜呈逐层生长模式。每一层生长为平面二维(2D)岛,厚度约为2.3 nm,其中ph - dntt分子几乎垂直地矗立在衬底上。层之间的高度差在这些图像中提供了颜色对比,可以直观地看到Si衬底上的初始2D岛与热生长的sio2和顶部表面的分形2D岛。利用该方法,在先前用O2plasma或UV-O3处理过的sio2表面上,在较高的衬底温度下形成了一层直径约为4 μm的孤立圆形2D孤岛。微拉曼测量也证实了DPh-DNTT层在衬底上的存在。
The growth mechanism of 2,9-diphenyl-dinaphtho [2,3-b:2′,3′-f]thieno [3,2-b]thiophene (DPh-DNTT) thin-films prepared by vacuum deposition was investigated based on the morphological crystallinity of the obtained films. In addition to atomic force microscopy, which is commonly used for imaging surface morphology, optical microscopy was also positively used for the same purpose. The technique allows the quick and easy evaluation of thin films. The optical microscopy images show that DPh-DNTT films grew according to a layer-by-layer growth mode. Each layer grew as flat two-dimensional (2D) islands with a thickness of about 2.3 nm, where DPh-DNTT molecules stand almost vertically on the substrate. The height difference between layers provided a color contrast in these images, which visualizes the initial 2D island on the Si substrate with thermally grown SiO2and fractal-shape 2D islands on top surface. By using the method, a monolayer of isolated and round 2D islands, with a diameter of approximately 4 μm, formed at a high substrate temperature on a SiO2surface that had been previously treated with O2plasma or UV-O3. The presence of a DPh-DNTT layer on the substrate was also confirmed by micro-Raman measurement.