Small angle X-ray scattering beamline at SSRF
Small angle X-ray scattering beamline at SSRF
复制标题
SSRF 的小角度 X 射线散射光束线
DOI:
10.13538/j.1001-8042/nst.26.030101
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发表时间:
2015-06-01
影响因子:
2.8
通讯作者:
Wang Jie
中科院分区:
文献类型:
--
作者:
Tian Feng;Li Xiu-Hong;Wang Jie
Beamline BL16B1 at Shanghai Synchrotron Radiation Facility(SSRF) is dedicated to studying the microstructure and dynamic processes of polymers, nanomaterials, mesoporous materials, colloids, liquid crystals,metal materials, etc. At present, SAXS, wide angle X-ray scattering(WAXS), simultaneous SAXS/WAXS,grazing incident SAXS, and anomalous SAXS techniques are available for end user to conduct diverse experiments at this beamline. The sample-to-detector distance is adjustable from 0.2 m to 5 m. The practicable q-range is 0.03–3.6 nm-1at incident X-ray of 10 ke V for conventional SAXS whilst a continuous q-region of0.06–33 nm-1can be achieved in simultaneous SAXS/WAXS mode. Time-resolved SAXS measurements in sub-second level was achieved by the beamline upgrating in 2013. This paper gives detailed descriptions about the status, performance and applications of the SAXS beamline.