Bias-stress stability and radiation response of solution-processed AlOx dielectrics investigated by on-site measurements
Bias-stress stability and radiation response of solution-processed AlOx dielectrics investigated by on-site measurements
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DOI：
10.1016/j.mee.2019.111113
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发表时间：
2019-09
影响因子：
2.3
通讯作者：
Fang Yuxiao-;Cezhou Zhao;I. Mitrovic;S. Hall;Li Yang;Chun Zhao
中科院分区：
文献类型：
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作者：
Fang Yuxiao-;Cezhou Zhao;I. Mitrovic;S. Hall;Li Yang;Chun Zhao
