A SmartBIST variant with guaranteed encoding
A SmartBIST variant with guaranteed encoding
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DOI：
10.1109/ats.2001.990304
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发表时间：
2001-11
期刊：
影响因子：
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通讯作者：
Bernd Könemann;C. Barnhart;B. Keller;T. Snethen;Owen Farnsworth;D. L. Wheater
中科院分区：
文献类型：
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作者：
Bernd Könemann;C. Barnhart;B. Keller;T. Snethen;Owen Farnsworth;D. L. Wheater
SmartBIST是适用于片上集成的一系列流扫描测试模式解码器的名称。自动测试模式生成（ATPG）算法经过修改，以高度压缩的源格式生成扫描测试刺激向量，该格式与SmartBIST解码器硬件兼容。压缩后的刺激向量从自动测试设备（ATE）传输到解码器，解码器将数据流实时扩展为完全扩展的扫描测试向量。SmartBIST编码和解码使用简单的代数技术，类似于lfsr编码（也称为lfsr重新播种）。本文展示的特定SmartBIST实现保证了所有测试立方体都可以通过改进的ATPG算法成功编码，而不管关心位的数量和位置如何。
SmartBIST is a name for a family of streaming scan test pattern decoders that are suitable for on-chip integration. The automatic test pattern generation (ATPG) algorithms are modified to generate scan test stimulus vectors in a highly compacted source format that is compatible with the SmartBIST decoder hardware. The compacted stimulus vectors are streamed from automatic test equipment (ATE) to the decoder, which expands the data stream in real-time into fully expanded scan test vectors. SmartBIST encoding and decoding use simple algebraic techniques similar to those used for LFSR-coding (also known as LFSR-reseeding). The specific SmartBIST implementation shown in this paper guarantees that all test cubes can be successfully encoded by the modified ATPG algorithm irrespective of the number and position of the care bits.