Density comparison measurements of silicon crystals by a pressure-of-flotation method at NMIJ
Density comparison measurements of silicon crystals by a pressure-of-flotation method at NMIJ
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NMIJ 采用浮选压力法对硅晶体进行密度比较测量
DOI：
10.1088/0026-1394/41/2/s06
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发表时间：
2004
期刊：
影响因子：
2.4
通讯作者：
K. Fujii
中科院分区：
文献类型：
--
作者：
A. Waseda;K. Fujii
介绍了一种基于压力浮选法的新型密度比较装置。对日本国家计量研究所（NMIJ）的一种新硅晶体进行了密度比较测量，用于密度标准和阿伏伽德罗常数的测定。用这种新的PFM装置对硅晶体进行密度比较测量，其相对标准不确定度估计为4.0 × 10−8。调整后的密度值进行评估，从PFM和绝对测量的数据，使用最小二乘算法，其中相关性被考虑在内。
A new density comparison apparatus based on a pressure-of-flotation method (PFM) is presented. Density comparison measurements are performed for a new silicon crystal of the National Metrology Institute of Japan (NMIJ) for the density standard and determination of the Avogadro constant. The density comparison measurement of silicon crystals by the new PFM apparatus has an estimated relative standard uncertainty of 4.0 × 10−8. Adjusted values of density are evaluated from the data of the PFM and absolute measurements using a least-squares algorithm, where correlations are taken into consideration.