Defect-Induced Charge Freezing on Epitaxial Fe_3O_4(001) Film Surfaces Studied by Spin・Polarized Scanning Tunneling Microscopy
Defect-Induced Charge Freezing on Epitaxial Fe_3O_4(001) Film Surfaces Studied by Spin・Polarized Scanning Tunneling Microscopy
复制标题
自旋·偏光扫描隧道显微镜研究外延 Fe_3O_4(001) 薄膜表面缺陷诱导电荷冻结
DOI:
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发表时间:
2005
期刊:
影响因子:
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通讯作者:
A.Subagyo
中科院分区:
文献类型:
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作者:
T.Takezaki;A.Subagyo;T.Takezaki;A.Subagyo;N.Uehara;T.Takezaki;A.Subagyo;H.Oka;A.Subagyo
DOI:
10.1007/s003390100739
发表时间:
2001
期刊:
Applied Physics A
影响因子:
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作者:
R. Koltun;M. Herrmann;G. Güntherodt;V. Brabers
通讯作者:
V. Brabers