Small-angle scattering in materials science - a short review of applications in alloys, ceramics and composite materials
Small-angle scattering in materials science - a short review of applications in alloys, ceramics and composite materials
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DOI：
10.1107/s0021889803000335
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发表时间：
2003-06-01
影响因子：
6.1
通讯作者：
Fratzl, P
中科院分区：
文献类型：
--
作者：
Fratzl, P
从早期的小角散射(SAS)开始，这项技术就被用来在纳米尺度上表征固体材料的结构。综述了这一领域的一些最新进展，重点介绍了合金、陶瓷和(纳米)复合材料。来自聚合物系统的SA的大领域将不会被涵盖。例如，SAS的经典应用是表征合金中的气孔或沉淀物。近年来，由于越来越多明亮的(同步加速器)X射线源的出现，出现了一系列X射线SAS的新应用。例如掠入射SAXS，越来越多地被用来表征半导体和其他材料上的纳米结构表面。窄X射线束的使用还允许通过扫描SAXS来研究极不均匀或分层结构的材料。在这种方法中，标本一步一步地穿过直径几微米(甚至更小)的X射线束，在每一步收集一个SAXS模式。在中子超声子系统中，磁截面的系统应用为磁性纳米粒子或纳米复合材料的研究带来了长足的进步。单晶或织构材料正被研究在与主光束有关的几个方向上，以产生三维(中子或X射线)SAS图案。在许多情况下，SAS与其他技术相结合，如电子显微镜、光谱学或机械表征，最优雅的是原位组合。文中将列举上述方法最近的一些例子。
Since the early days of small-angle scattering (SAS), this technique has been used to characterize the structure of solid materials on the nanometer scale. Some recent developments in this field will be reviewed, focusing on alloys, ceramics and (nano-) composite materials. The large field of SAS from polymeric systems will not be covered. Classical applications of SAS are the characterization of pores or precipitates in alloys, for instance. In more recent years, a range of new applications for X-ray SAS has emerged owing to the availability of more and more brilliant (synchrotron) X-ray sources. Examples include grazing-incidence SAXS, used increasingly to characterize nano- structured surfaces on semiconductors and also on other materials. The use of a narrow X-ray beam also allows the investigation of extremely inhomogeneous or hierarchically structured materials by scanning SAXS. In this approach, the specimen is moved step by step across an X-ray beam with a diameter of a few micrometers (or even less), collecting a SAXS pattern at each step. In neutron SAS, the systematic use of magnetic cross-sections has brought considerable progress in the study of magnetic nano- particles or nano- composites. Single crystalline or textured materials are being studied under several orientations with respect to the primary beam to yield three-dimensional (neutron or X-ray) SAS patterns. In many cases, SAS is combined with other techniques, such as electron microscopy, spectroscopy or mechanical characterization, the most elegant being an in-situ combination. A number of recent examples for the above-mentioned approaches will be given.