Polychromator system for multielement determination by gas chromatography with helium plasma atomic emission spectrometric detection
Polychromator system for multielement determination by gas chromatography with helium plasma atomic emission spectrometric detection
复制标题
氦等离子体原子发射光谱检测气相色谱多元素测定多色仪系统
DOI：
10.1021/ac00258a006
复制
发表时间：
1983
影响因子：
7.4
通讯作者：
Thomas A. Ridgway
中科院分区：
文献类型：
--
作者：
M. Eckhoff;J. Caruso;Thomas A. Ridgway
本文介绍了一种多色仪/微机系统，可在整个色谱运行过程中同时监测四个原子发射波长。安装在步进电机上的折射板用于获取每个发射波长的背景信息。通过适当地步进折射器板，还获得每个波长处的信号加背景信息。因此，随着色谱法的进行，动态背景校正的数据点被绘制，产生多通道色谱图。这种背景校正的重要性通过显著增强的选择性和消除或最小化“假峰”而清楚地证明。这种多通道检测器方法可以减少色谱的模糊性，并与He等离子体元素发射导致确定洗脱物质的经验公式。本文报道了一系列重要化合物的检测限、线性动态范围和精密度。绝对检测限为纳克级，精密度约为5%相对标准偏差。这些比较以及与那些报道的单通道发射方法，同时保留高选择性的背景校正实验office.The最近复苏的原子发射光谱作为元素分析的方法，可归因于使用的电感耦合等离子体（ICP），直流等离子体（DCP），和微波诱导等离子体（MIP）作为激发源。这些类型的等离子体提供的高温（5000-7000 K）、稳定性和惰性气氛导致在以下情况下在痕量水平上的改进的分析性能：
A polychromator/mlcrocomputer system has been developed to simultaneously monitor four atomic emission wavelengths throughout an entire chromatographic run. A refractor plate mounted on a stepper motor Is used to acquire background Information at each emission wavelength. By appropriately stepping the refractor plate, one also obtains signal plus background information at each wavelength. Thus, as the chromatography proceeds, dynamically background corrected data points are plotted yielding multichannel chromatograms. The Importance of such background correction IS clearly demonstrated through markedly enhanced selectlvltles and elimination or minimization of “false peaks”. This multichan-nel detector approach can reduce chromatographic ambigu-ities and with He plasma elemental emission lead to determination of empirical formulas for the eluting substances. Detection limits, linear dynamic ranges, and precisions available by this technique are reported for a series of en-vironmentally Important compounds. Absolute detection limits are at nanogram levels and precisions are on the order of 5% relative standard deviation. These compare well with those reported for single-channel emission methods while retaining the high selectivity that the background corrected experiment affords.The recent resurgence of atomic emission spectrometry as a method for elemental analysis may be attributed to the use of the inductively coupled plasma (ICP), direct current plasma (DCP), and microwave induced plasma (MIP) as excitation sources. The high temperature (5000-7000 K), stability, and inert atmosphere provided by these types of plasmas result in an improved analytical performance at trace levels when