Effect of a dislocation pile-up at the neutral axis on trans-crystalline crack growth for micro-bending fatigue
Effect of a dislocation pile-up at the neutral axis on trans-crystalline crack growth for micro-bending fatigue
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DOI:
10.1016/j.ijfatigue.2016.09.015
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发表时间:
2017-01-01
影响因子:
6
通讯作者:
Motz, Christian
中科院分区:
文献类型:
--
作者:
Eisenhut, Lena;Schaefer, Florian;Motz, Christian
Micro-bending beams of the f.c.c. nickel based superalloy CMSX-4, machined by the focused ion beam technique (FIB), are used to study the effect of a stress gradient associated with the bending configuration on the fatigue crack growth behavior in small dimensions. To avoid an impact of dislocation reactions on the crack growth behavior, a trans-crystalline stage-I fatigue crack has been initiated at a notch placed on a slip plane in a single-slip geometry with the highest Schmid factor. da/dN-curve data was gathered by visual crack extension observation during in-situ fatigue in the SEM combined with experimental compliance measurements and FEM-simulations. A dislocation pile-up at the neutral axis results in a significant Bauschinger effect and a back stress acting on the crack tip causing a crack deceleration and an early change from stage-I to stage-II fatigue crack growth analyzed by FIB tomography. (C) 2016 Elsevier Ltd. All rights reserved.