Double-pass point diffraction interferometer
Double-pass point diffraction interferometer
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DOI：
10.1088/0957-0233/21/10/105307
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发表时间：
2010-10
影响因子：
2.4
通讯作者：
H. Kihm;Yunwoo Lee
中科院分区：
文献类型：
--
作者：
H. Kihm;Yunwoo Lee
提出了一种新的用于光学定性分析的点衍射干涉仪。点衍射两次产生干涉波与一个单一的针孔偏振器。从针孔偏振器的衍射使参考和测量波具有双通配置。四分之一波片在往复运动后旋转它们的偏振角。衍射-未衍射测量波和未衍射-衍射参考波之间的干涉图由于共路径配置而对振动不敏感。我们通过改变测试光学系统的针孔尺寸和衍射波的发散角来检验其性能。
We propose a new point diffraction interferometer for qualitative optical analysis. Point diffraction is made two times to generate interfering waves with a single pinholed polarizer. Diffraction from a pinholed polarizer makes reference and measurement waves with a double-pass configuration. A quarter-wave plate rotates their polarization angles after reciprocation. The interferogram between the diffracted–undiffracted measurement wave and the undiffracted–diffracted reference wave is vibration-insensitive due to a common-path configuration. We examined its capability by changing the pinhole size and divergence angle of the diffracted wave for test optics with various numerical apertures.