Low-frequency dispersion characteristics of GaN HFETs

Low-frequency dispersion characteristics of GaN HFETs
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GaN HFET 的低频色散特性

DOI:
10.1049/el:19951298
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发表时间:
1995
影响因子:
1.1
通讯作者:
K. Doverspike
K. Doverspike
中科院分区:
工程技术4区
文献类型:
--
作者:
W. Kruppa;S. Binari;K. Doverspike

文献摘要

被引文献

相似文献

研究了AlN/GaN高频场效应管的低频跨导和输出电阻随温度的变化规律。发现了色散特性,这表明在GaN通道层中存在捕获活性。活化能接近1 eV的陷阱很明显。
The low-frequency transconductance and output resistance of AlN/GaN HFETs have been examined as functions of temperature. Dispersive characteristics were found which are indicative of trapping activity in the GaN channel layer. Traps with an activation energy near 1 eV were evident.