Improvement of the precision of lattice parameter determination by nano-beam electron diffraction
Improvement of the precision of lattice parameter determination by nano-beam electron diffraction
复制标题
纳米束电子衍射测定晶格参数精度的提高
DOI：
10.1093/jmicro/dft023
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发表时间：
2013
期刊：
影响因子：
1.8
通讯作者：
and N. Tanaka
中科院分区：
文献类型：
--
作者：
K. Saitoh;H. Nakahara;and N. Tanaka
提出了使用纳米束电子衍射中观察到的高阶劳厄区（HOLZ）反射来高精度测定晶格参数。引入超过 40 个 HOLZ 反射，其位置通过考虑电子光学像差进行校正，并以 0.04 nm−1 的精度确定，使我们能够实现 0.02% 误差的极高精度，比没有 HOLZ 反射的精度高四倍。
A highly precise determination of lattice parameters using higher-order Laue zone (HOLZ) reflections observed in nano-beam electron diffraction is presented. The introduction of more than 40 HOLZ reflections, whose positions are corrected by considering the aberration of the electron optics and are determined with an accuracy of 0.04 nm−1, allows us to achieve a remarkable high precision of a 0.02% error, which is four times higher than the precision without HOLZ reflections.