An on-chip jitter measurement circuit with sub-picosecond resolution
An on-chip jitter measurement circuit with sub-picosecond resolution
复制标题
具有亚皮秒分辨率的片上抖动测量电路
DOI：
10.1109/esscir.2005.1541583
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发表时间：
2005
期刊：
影响因子：
--
通讯作者：
D. Heidel
中科院分区：
文献类型：
--
作者：
K. Jenkins;A. Jose;D. Heidel
一个精确的定时抖动的片上测量电路的演示。与电路的测量显示出良好的再现相应的片外测量与示波器，和分辨率测量显示的抖动分辨率的电路优于0.4 ps rms。该电路是非常紧凑的，占用3200 /spl mu/m/sup 2/在0.13/spl mu/m，1.2V，CMOS技术，并在这种技术工作高达2.5 GHz。
A circuit for accurate on-chip measurement of timing jitter is demonstrated. Measurements with the circuit show excellent reproduction of corresponding off-chip measurements made with an oscilloscope, and resolution measurements show the jitter resolution of the circuit to be better than 0.4 ps rms. The circuit is very compact, occupying 3200 /spl mu/m/sup 2/ in a 0.13/spl mu/m, 1.2V, CMOS technology, and operates up to 2.5 GHz in this technology.