Calibration of the scanning Kelvin probe force microscope under controlled environmental conditions
Calibration of the scanning Kelvin probe force microscope under controlled environmental conditions
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DOI：
10.1016/j.electacta.2012.01.054
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发表时间：
2012-04-01
影响因子：
6.6
通讯作者：
Williams, G.
中科院分区：
文献类型：
--
作者：
Cook, A. B.;Barrett, Z.;Williams, G.
通过扫描开尔文探针力显微镜 (SKPFM) 确定了镀铂 AFM 尖端和具有薄湿度诱导表面电解质层的各种纯金属样品之间的局部伏特电势差 (Delta psi)。 SKPFM 得出的 Delta psi 显示与使用扫描开尔文探针 (SKP) 在名义上相同的环境条件下获得的相同量的线性相关性；斜率在实验误差一内。通过利用这种相关性并使用先前针对一系列金属/水金属离子氧化还原对校准的 SKP，可以利用电化学势间接校准大气 SKPFM 导出的 Delta psi。在 NaCl 电解质中的浸入腐蚀电位 (E-corr) 与 SKP 在存在 NaCl 剂量湿度层的情况下确定的 Delta psi 之间也获得了良好的相关性。这意味着 SKPFM 可以直接针对浸没 E-corr 进行校准，前提是 SKPFM 测量是在大气相对湿度和表面电解质剂量的适当控制条件下进行的。 (C) 2012 Elsevier Ltd. 保留所有权利。
Local Volta potential differences (Delta psi) between a platinum coated AFM tip and various pure metal specimens with a thin humidity induced surface electrolyte layer have been determined via scanning Kelvin probe force microscopy (SKPFM). SKPFM derived Delta psi display a linear correlation with the same quantities obtained under nominally identical environmental conditions using a scanning Kelvin probe (SKP); the slope is within experimental error one. By exploiting this correlation and using a SKP previously calibrated versus a series of metal/aqueous metal ion redox couples it is possible to indirectly calibrate atmospheric SKPFM derived Delta psi with electrochemical potential. Good correlation is also obtained between immersion corrosion potential (E-corr) in NaCl electrolyte and SKP determined Delta psi in the presence of a NaCl dosed humidity layer. This implies that SKPFM may be calibrated directly against immersion E-corr provided SKPFM measurements are performed under suitably controlled conditions of atmospheric relative humidity and surface electrolyte dosing. (C) 2012 Elsevier Ltd. All rights reserved.