Further investigations into capacitive imaging for NDE
Further investigations into capacitive imaging for NDE
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DOI：
10.1784/insi.2009.51.9.484
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发表时间：
2009-09
期刊：
影响因子：
1.1
通讯作者：
X. Yin;G. Diamond;D. Hutchins
中科院分区：
文献类型：
--
作者：
X. Yin;G. Diamond;D. Hutchins
对应用于 NDE 的电容成像 (CI) 技术进行了进一步的研究。采用二维有限元方法来模拟电容电极的电场分布以及它们如何与样品相互作用。还评估了可能的探头设计以及设计参数对探头性能的影响。包括绝缘体和金属在内的各种样品的结果说明了该技术的应用范围。
Further investigations are presented into the capacitive imaging (CI) technique for application to NDE. A two-dimensional finite element method is employed to simulate the electric field distribution from capacitive electrodes and how them, interact with samples. Possible probe designs and the effects of design parameters on probe performance are also evaluated. Results from various samples, including insulators and metals, are presented to illustrate the range of application of the technique.