Interlayer tunneling spectroscopy and evidence for the evolution of a pseudogap in Bi2Sr2CaCu2O8
Interlayer tunneling spectroscopy and evidence for the evolution of a pseudogap in Bi2Sr2CaCu2O8
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Bi2Sr2CaCu2O8 中的层间隧道光谱和赝能隙演化的证据
DOI：
10.1143/jpsj.67.732
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发表时间：
1998
影响因子：
1.7
通讯作者：
Kazuichi Namekawa
中科院分区：
文献类型：
--
作者：
M. Suzuki;S. Karimoto;Kazuichi Namekawa
报道了在Bi2Sr2CaCu2O8单晶表面制备的非常薄的本征约瑟夫森结的层间隧道谱。研究发现，在180K以下有一个伪隙演化，并且在Tc以下继续存在。研究还发现，在伪隙内，超导能隙在T_c以下演化。作为这一发现的结果，结果表明，半导体c轴的电阻率可以用赝隙的形式直接解释，并且隧道电阻与温度无关。
We report on interlayer tunneling spectroscopy using very thin stacks of intrinsic Josephson junctions fabricated on the surface of a Bi 2 Sr 2 CaCu 2 O 8 single crystal. It is found that a pseudogap evolves below 180 K and continues to exist below T c . It is also found that the superconducting gap evolves below T c within the pseudogap. As a consequence of this finding, it is shown that the semiconductive c -axis resistivity can be interpreted in a straightforward manner in terms of the pseudogap and that the tunneling resistance is temperature independent.