X-ray Rietveld structure refinement and bond-valence analysis of Cs2TeI6
X-ray Rietveld structure refinement and bond-valence analysis of Cs2TeI6
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DOI:
10.30970/cma3.0127
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发表时间:
2010
期刊:
影响因子:
--
通讯作者:
V. Sidey;O. Zubaka;I. Stercho;E. Peresh
中科院分区:
文献类型:
--
作者:
V. Sidey;O. Zubaka;I. Stercho;E. Peresh
The crystal structure of the ternary iodide Cs2TeI6 has been refined by Rietveld analysis of X-ray powder diffraction data. The refinement procedure was stopped when the intensity residual RB = 3.7 % had been reached. Cs2TeI6 crystallizes in the cubic K2PtCl6 structure type, space group Fm-3m (No. 225), with the lattice parameter a = 11.6939(8) A, Z = 4, Dc = 4.797(1) g/cm . The reliability of the structural model obtained for Cs2TeI6 in the Rietveld refinement was confirmed by a bond-valence analysis of the structure. For the first time, the bond-valence parameters (r0 = 2.782 A and b = 0.37 A) have been determined for the Te /I ion pair, from a set of 14 well-determined coordination shells [TeIn]. These parameters show a reasonably high performance and can be recommended for routine bond-valence analyses of structures containing Te–I chemical bonds.