Tunneling in Graphene/h-BN/Graphene Heterostructures through Zero-Dimensional Levels of Defects in h-BN and Their Use as Probes to Measure the Density of States of Graphene
Tunneling in Graphene/h-BN/Graphene Heterostructures through Zero-Dimensional Levels of Defects in h-BN and Their Use as Probes to Measure the Density of States of Graphene
复制标题
通过六方氮化硼缺陷的零维水平在石墨烯/六方氮化硼/石墨烯异质结构中的隧道效应及其用作测量石墨烯态密度的探针
DOI:
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发表时间:
2019
期刊:
影响因子:
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通讯作者:
K. Novoselov
中科院分区:
文献类型:
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作者:
Y. Khanin;E. Vdovin;M. V. Grigor’ev;O. Makarovsky;M. Alhazmi;S. Morozov;S. Morozov;Artem Mishchenko;K. Novoselov
The evolution of the manifestation of levels of defects in h-BN in tunneling through graphene/h-BN/graphene heterostructures with various degrees of perfection, from completely defectless to those with several tens of levels in the band gap of h-BN, has been studied. It has been shown that the behavior of these levels is related to the motion of Dirac points and the chemical potentials of graphene layers at change in the bias and gate voltages, which is described by the electrostatic model of an ideal defectless heterostructure. The density of states of graphene in a magnetic field has been studied by its probing by the level of a single defect with a sensitivity allowing the detection of splitting of the zeroth Landau level caused by the lifting of the spin and valley degeneracy already at B ∼ 4 T.