High level fault injection for attack simulation in smart cards
High level fault injection for attack simulation in smart cards
复制标题
用于智能卡中攻击模拟的高级故障注入
DOI：
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复制
发表时间：
2004
期刊：
影响因子：
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通讯作者：
Andreas Mühlberger
中科院分区：
文献类型：
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作者：
K. Rothbart;U. Neffe;C. Steger;R. Weiss;E. Rieger;Andreas Mühlberger
智能卡是当今使用的最小的计算平台之一。它们用于越来越多的安全应用。为了获取敏感数据，对智能卡进行了大量的安全攻击。因此，必须测试智能卡在安全方面的稳健性。测试非常耗时，并且通常在设计过程的后期执行。本文提出了一种用于智能卡安全攻击模拟的高级故障注入方法。介绍了SystemC设计中的故障注入技术，并给出了故障注入工具。此外，描述了系统的行为分析。初步结果表明，这种方法可以帮助发现系统组件容易受到安全攻击。
Smart cards are one of the smallest computing platforms in use today. They are used in an increasing number of security applications. To gain sensitive data, a lot of security attacks are performed on smart cards. Therefore it is mandatory to test smart cards for robustness in matters of security. Tests are very time consuming and are performed often very late in the design process. This paper presents a methodology for high-level fault injection for security attack simulation in smart cards. The fault injection technique into SystemC designs is described and the fault injection tool is presented. Moreover, the system behaviour analysis is depicted. Preliminary results show that this methodology can assist in finding system components vulnerable to security attacks.