Use of highly energetic (116 keV) synchrotron radiation for X-ray fluorescence analysis of trace rare-earth and heavy elements.
Use of highly energetic (116 keV) synchrotron radiation for X-ray fluorescence analysis of trace rare-earth and heavy elements.
复制标题
使用高能 (116 keV) 同步加速器辐射对痕量稀土元素和重元素进行 X 射线荧光分析。
DOI：
10.1107/s0909049501006410
复制
发表时间：
2001
影响因子：
2.5
通讯作者：
Y. Sakurai
中科院分区：
文献类型：
--
作者：
I. Nakai;Y. Terada;M. Itou;Y. Sakurai
这项研究揭示了使用116keV X射线作为X射线荧光(XRF)分析的激发源的优点。该技术适用于稀土等重元素的无损多元素分析。对于JG-1标准参考样品(花岗岩)的整体分析，最低MDL值估计为W的0.1ppm，用于500 S测量。SRM612标准玻璃样品的光谱显示，在50ppm水平上，30多种元素，包括所有现有的稀土元素，都有清晰的K线峰。测定稀土元素的校正曲线表明，X射线荧光强度与浓度在10-0.03 ng范围内呈线性关系。这项强大的技术应该有助于对地质、地球化学和考古样品以及工业材料中的稀土和重元素进行无损分析。
This study has revealed the advantages of the use of 116 keV X-rays as an excitation source of X-ray fluorescence (XRF) analyses. This technique is suitable for nondestructive multielemental analyses of heavy elements such as rare-earth elements. The lowest MDL value evaluated for the bulk analysis of a JG-1 standard reference sample (granite rock) was 0.1 ppm for W for a 500 s measurement. The spectrum of standard glass samples of SRM612 demonstrated clearly resolved K-line peaks of more than 30 elements, including all the existing rare-earth elements, at 50 ppm levels. The calibration curve for the determination of a rare-earth element shows a linear relation between the XRF intensity and concentrations from 10 to 0.03 ng. This powerful technique should be useful for nondestructive analyses of rare-earth and heavy elements in geological, geochemical and archaeological samples as well as industrial materials.