Visibility of two-dimensional layered materials on various substrates
Visibility of two-dimensional layered materials on various substrates
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DOI：
10.1063/1.4930574
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发表时间：
2015-10-14
影响因子：
3.2
通讯作者：
Knoch, J.
中科院分区：
文献类型：
--
作者：
Mueller, M. R.;Gumprich, A.;Knoch, J.
为了研究石墨烯、过渡金属二硫属化物、氮化硼及其异质结构等二维层状材料，需要专用基板才能通过光学显微镜进行明确识别。进行了系统研究，重点关注各种二维层状材料和基材。显示模拟颜色并与显微镜图像进行比较。此外，还讨论了定义衡量可见度的适当指标的问题。对于各种基板堆叠，给出了最佳可见度的层厚度以及最终的 sRGB 颜色。可以使用我们的模拟工具对定制堆栈进行进一步模拟，该工具可供下载，并包含一个包含各种材料的数据库。 (C) 2015 AIP 出版有限责任公司。
For the investigation of 2D layered materials such as graphene, transition-metal dichalcogenides, boron nitride, and their heterostructures, dedicated substrates are required to enable unambiguous identification through optical microscopy. A systematic study is conducted, focusing on various 2D layered materials and substrates. The simulated colors are displayed and compared with microscopy images. Additionally, the issue of defining an appropriate index for measuring the degree of visibility is discussed. For a wide range of substrate stacks, layer thicknesses for optimum visibility are given along with the resulting sRGB colors. Further simulations of customized stacks can be conducted using our simulation tool, which is available for download and contains a database featuring a wide range of materials. (C) 2015 AIP Publishing LLC.