Direct Observation of Channel Structures in Zeolite Y and A with a Slow-Scan, Charge-Coupled-Device Camera.
Direct Observation of Channel Structures in Zeolite Y and A with a Slow-Scan, Charge-Coupled-Device Camera.
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使用慢扫描电荷耦合器件相机直接观察 Y 型和 A 型沸石中的通道结构。
DOI：
10.1002/chin.199540292
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发表时间：
1995
期刊：
影响因子：
--
通讯作者：
A. Saji
中科院分区：
文献类型：
--
作者：
Y. Sasaki;Toshiyuki Suzuki;Y. Ikuhara;A. Saji
沸石材料对电子束辐照非常敏感。因此，只有有限的尝试使用高分辨率电子显微镜（HREM）来表征它们的结构。对电子束的灵敏度在很大程度上取决于沸石中的Si/Al比。慢扫描电荷耦合器件（CCD）相机提供了使用HREM以非常低的光束剂量观察材料的可能性。在这项研究中，这种方法被应用到观察敏感材料，如沸石型A和型Y，并记录HREM图像没有任何损害造成的电子辐照剂量密度小于0。2 A /cm 2。发现沸石中的精细通道结构、解理面和电子辐照过程可以使用具有慢扫描CCD相机的HREM来表征。
Zeolite materials are very sensitive to electron beam irradiation. Therefore, there have been only limited attempts to characterize their structures using high‐resolution electron microscopy (HREM). The sensitivity to the electron beam depends strongly on the Si/Al ratio in zeolites. A slow‐scan, charge‐coupled‐device (CCD) camera provides the possibility to observe materials using HREM with very low beam doses. In this study, this method was applied to observe sensitive materials such as zeolite type A and type Y, and HREM images were recorded without any damage caused by electron irradiation under a dose density less than 0. 2 A /cm2. It was found that fine channel structures, cleavage planes, and the electron irradiation process in the zeolites could be characterized using HREM with the slow‐scan CCD camera.