Epitaxial Thin Films of a Chalcogenide Perovskite

Epitaxial Thin Films of a Chalcogenide Perovskite
复制标题

DOI:
10.1021/acs.chemmater.1c02202
复制
发表时间:
2021-05
影响因子:
8.6
通讯作者:
Mythili Surendran;Huandong Chen;Boyang Zhao;A. Thind;Shantanu Singh;T. Orvis;Huan Zhao;Jae-Kyung Han
Mythili Surendran;Huandong Chen;Boyang Zhao;A. Thind;Shantanu Singh;T. Orvis;Huan Zhao;Jae-Kyung Han
中科院分区:
材料科学2区
文献类型:
--
作者:
Mythili Surendran;Huandong Chen;Boyang Zhao;A. Thind;Shantanu Singh;T. Orvis;Huan Zhao;Jae-Kyung Han

文献摘要

相似文献

硫系钙钛矿是一类新型的电子材料,但由于缺乏高质量的外延薄膜,硫系钙钛矿的基本性质和应用仍然受到限制。我们报道了一种典型的硫系化合物BaZrS3的外延薄膜生长。
Chalcogenide perovskites have emerged as a new class of electronic materials, but fundamental properties and applications of chalcogenide perovskites remain limited by the lack of high quality epitaxial thin films. We report epitaxial thin film growth of BaZrS3, a prototypical chalcogenide,