Electronic States in High- T c Copper-Oxide Superconductors. II

Electronic States in High- T c Copper-Oxide Superconductors. II
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高温氧化铜超导体中的电子态。

DOI:
10.1143/jpsj.59.2820
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发表时间:
1990
影响因子:
1.7
通讯作者:
Y. Kuroda
Y. Kuroda
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
Hisao Jichu;T. Matsuura;Y. Kuroda

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本文用p-d模型研究了CuO 2层中的电子态,并采用辅助玻色子方法处理了局域电子关联。已经发现的是:在足够低的温度下,电子态形成相干带,其宽度和强度强烈地取决于掺杂载流子的数量(对于空穴比电子更显著)和p-d电荷转移能量。特别地,当掺杂空穴数nh较小时,在能隙内费米能级附近形成一个新的能带,其宽度和强度与nh成正比。即便如此,费米面仍然由未成对电子的总数决定,这些电子主要是局域d电子。
The electronic states in the CuO 2-layer have been studied by using the p-d model with the help of the auxiliary boson method for treating the local electronic correlation properly. What have been found are: at sufficiently low temperature the electronic states form coherent bands, whose width and intensity are strongly depending upon number of doped carriers (more significantly for holes than electrons) and the p-d charge transfer energy. In particular, when the number of doped-holes n h is small, a new band form around the Fermi level inside the energy gap and its width and intensity are proportional to n h. Even then the Fermi surface is still determined by the total number of unpaired electrons which are mainly of the localized d-electrons.
DOI: 10.1007/bf01303701
发表时间: 1986-01-01
期刊: ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER
影响因子: --
作者:
BEDNORZ, JG;MULLER, KA
通讯作者: MULLER, KA