Submicron hiati in acid-etched dentin are artifacts of desiccation.
Submicron hiati in acid-etched dentin are artifacts of desiccation.
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酸蚀牙本质中的亚微米裂隙是干燥的产物。
DOI：
10.1016/s0109-5641(02)00007-6
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发表时间：
2003
期刊：
影响因子：
--
通讯作者：
Pashley,DavidH
中科院分区：
文献类型：
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作者：
Agee,KelliL;Pashley,EdnaL;Itthagarun,Anut;Sano,Hidehiko;Tay,FranklinR;Pashley,DavidH
目的亚微米间隙代表了牙本质酸蚀粘合时胶原蛋白网络基底和矿化牙本质之间的潜在空间。这些空间是在酸蚀牙本质标本在六甲基二硅烷中进行临界点干燥或脱水后，在扫描电镜研究中观察到的。然而，它们从未在牙本质混合层的 TEM 研究中被识别出来。本研究使用银染色技术测量纳米泄漏，严格检查了亚微米裂隙形成的原因。方法检查了两种多步全蚀刻粘合剂（One-Step，Bisco；Single Bond，3M）和两种单步自蚀刻粘合剂（Prompt L-Pop，ESPE；One-Up Bond F，Tokuyama）。平坦的牙本质表面用这些粘合剂和衬里复合材料粘合。在每个粘合剂组中，来自同一粘合牙齿的 0.8 毫米厚的板在距粘合界面 1 毫米处涂有指甲油。将清漆完全干燥 10 分钟，然后在 50wt% 硝酸银 (AgNO3) 中浸泡 24 小时（D 组），或者将其涂在沾污的牙板上，然后立即滴入 AgNO3 溶液中（M 组）。显影后，制备未脱矿、未染色的环氧树脂包埋切片，用于透射电子显微镜 (TEM) 以确定银吸收的量和分布。结果在所有粘合剂粘合牙齿中均观察到纳米渗漏模式，无论品牌如何。在下面的未脱矿质牙本质中也发现了细小的网状银沉积物。在 D 组中，亚微米 hiati 被视为混合层下方重银沉积物的隧道。具体来说，未脱矿的小管间牙本质和附着在混合层基底上的相同基质的内聚断裂层之间出现间隙。无论粘合剂的品牌如何，M 组中完全不存在 Hiati。 意义 亚微米 hiati 是标本处理过程中干燥产生的伪影，在未来的粘合牙本质界面研究中应如此提及。
ObjectivesThe submicron hiatus represents a potential space between the base of the collagen network and the mineralized dentin when dentin is acid-etched for bonding. These spaces were observed in SEM studies after acid-etched dentin specimens were critical point dried or dehydrated in hexamethyldisilasane. However, they have never been identified in TEM studies of dentin hybrid layers. This study critically examined the cause of submicron hiati formation using a silver staining technique to measure nanoleakage.MethodsTwo multi-step, total-etch adhesives (One-Step, Bisco; Single Bond, 3M) and two single-step, self-etching adhesives (Prompt L-Pop, ESPE; One-Up Bond F, Tokuyama) were examined. Flat dentin surfaces were bonded with these adhesives and a lining composite. In each adhesive group, 0.8mm thick slabs from the same bonded tooth were coated with nail varnish applied 1mm from the bonded interfaces. The varnish was either left to dry completely for 10min before immersing in 50wt% silver nitrate (AgNO3) for 24h (group D), or painted on blotted tooth slabs that were immediately dropped into the AgNO3solution (group M). After developing, undemineralized, unstained, epoxy resin-embedded sections were prepared for transmission electron microscopy (TEM) to identify the amount and distribution of silver uptake.ResultsNanoleakage patterns were observed in all adhesive-bonded teeth, regardless of brand. Fine reticular silver deposits were also found in the underlying undemineralized dentin. In group D, submicron hiati were seen as tunnels of heavy silver deposits beneath hybrid layers. Specifically, a hiatus occurred between the undemineralized intertubular dentin and a cohesively fractured layer of the same matrix that was attached to the base of the hybrid layer. Hiati were completely absent in group M, regardless of the brand of adhesive.SignificanceSubmicron hiati are artifacts created by desiccation during specimen processing, and should be referred to as such in future studies of bonded dentin interfaces.